BGA Incircuit Tester:
WTX-3000 for BGA Testing

WTX-3000 equips MAP Test which makes it possible to detect IC open defect, and Bus DIFF Test which makes possible to detect data bus circuit which was impossible with ordinal InCircuit Tester. The power is shown for the Lead open detection in the BGA and CSP packages and the data bus circuit. Moreover, highly accurate measurement became possible over the wide range as the digital phase measurement was developed in the CRL composite circuit. In addition, the AC motor soft press of which air equipment is unnecessary, restrains stress to print circuit board to minimum. WTX-3000 is the InCircuit Tester that can be highly relied upon in the matter of today's quality control systems.

IC open detection High reliability test Position indication of defective Complying with the quality control process AC motor soft press Network Control Indication of pin position data Pin Search voice output Double press (OP) Class password		Relay test Standard self-diagnosis function High precision self-diagnosis (OP) Kelvin connection Continuous defective warning Print output of defective position Pass stamp (OP) One touch receiver (OP) Air press unit

IC Open PIN Detection		Defective parts locater

Compatible with QC systems		AC motored Soft-Press

Pin position indicator